Abstract: Concurrent error detection (CED) is an important technique in the design of system in which dependability and data integrity are important. Using the separable code for CED has the advantage that no decoding is needed to get the normal output bits. In this paper, we address the problem of synthesizing totally self-checking two-level combinational circuits starting from a VHDL description. Three schemes for CED are proposed. The first scheme uses duplication of a combinational logic with the addition of a totally self-checking comparator. The second scheme for synthesizing combinational circuits with CED uses Bose-Lin code. The third scheme is based on parity codes on the outputs of a combinational circuit. The area overheads and operating speed decreases for seven combinational circuits of standard architecture are reported in this paper.
Keywords: Concurrent error detection, totally self-checking circuits, error-detecting codes, VHDL.