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Automatic Control and Measurement
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B. Santrač and V. Vujičić:
Measuring Device for Determination Fault Location in Transmission
Lines Based on Stochastic Adding A/D Conversion
.... 165
Computer Science
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K. Samu and K. Wenzel:
Presenting Surface Colors Computer Controlled CRT Displays
.... 177
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N. Jovanović, R. Popović, and Z. Jovanović:
Defining a General Object Model of Distributed Systems Entities in
Java
.... 185
Microelectronics and Materials
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L. Bouzerara and M. T. Belaroussi:
Current Mode Approach: High Performance 0.35 μm CMOS
Class AB Push-Pull Current Amplifier
.... 195
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S. Richter, S. Bormann, and V. Nakov:
Layout Considerations for High Temperature SRAM Cells
in a SOI Technology
.... 205
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G. Jovanović and M. Stojčev:
Voltage Controlled Delay Line for Digital Signal
.... 215
Power Engineering
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R. Meziane, H. Hamdaoui, M. Rahli, and A. Zeblah:
Structure Optimization of Electrical Power Network
Using Ant Colony Approach
.... 233
Signal Processing
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M. Bandjur:
Novel Method of Discrete Message Ciphering with Equal Length
of Message and Cryptogram
.... 251
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A. Matović and M. Matović:
Sensitivity Optimization of Direct Form Realization of Active-RC
All-pole Filters
.... 259
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I. Djellit and M. R. Ferchichi:
Homoclinic and Heteroclinic Bifurcations in a Two-Dimensional
Endomorphism
.... 273
BOOK REVIEWS
-
PROGRAMMABLE LOGIC CONTROLLERS
by John W. Webb, Ronald A. Reis
.... 285
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ITANIUM ARCHITECTURE FOR PROGRAMMERS:
Understanding 64-bit Processors and EPIC Principles
by James S. Evans, Gregory I. Trimper
.... 288
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DATABASE SYSTEM: The Complete Book
by Hector Garcia-Molina, Jeffery D. Ullman, Jenniffer Widom
... 291
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